Semiconductor device having high energy sustaining capability and a temperature compensated sustaining voltage

ABSTRACT

A semiconductor device having an improved protection scheme and a temperature compensated sustaining voltage is provided by integrating a plurality of temperature compensated voltage reference diodes between the drain and the gate of the semiconductor device. The diodes protect the device by clamping the device&#39;s sustaining voltage to the total avalanche voltage of the diode. The device will dissipate any excessive energy in the conduction mode rather than in the more stressful avalanche mode. In addition, the plurality of diodes will provide for a temperature compensated sustaining voltage of the semiconductor device. The plurality of diodes are formed back-to-back in polysilicon. The positive temperature coefficient of the avalanching junction of each diode pair is compensated for by the negative temperature coefficient of the forward biased junction.

This application is a continuation of prior application Ser. No.08/037,501, filed Mar. 24, 1993, now abandoned, which is a continuationof prior application Ser. No. 07/278,988, filed Dec. 2, 1988, abandoned.

BACKGROUND OF THE INVENTION

This invention relates, in general, to semiconductor devices and, moreparticularly, to a monolithic temperature compensated voltage referencediode and method of integration into a semiconductor device to achieve atemperature compensated sustaining voltage and high energy sustainingcapabilities.

In the past, several schemes have been used to protect semiconductordevices from potentially destructive voltages and currents. Suchconditions are commonly encountered in the application of powersemiconductor devices. For example, a power semiconductor device such asa power MOSFET, is frequently used to switch inductive loads. When thepower MOSFET is switched off, the energy stored in the inductor willforce the drain voltage of the power MOSFET to rise rapidly above thesupply voltage. If no limiting means are employed, this rise willcontinue until the drain-source avalanche voltage of the power MOSFET isreached, whereupon the energy stored in the inductor will be dissipatedin the power MOSFET during device avalanche. Such dissipation can causeavalanche stress-induced failure of the power MOSFET.

A more manageable form of stress commonly occurs in the operation ofpower semiconductor devices as the device switches current on and offwithin its normal mode of conduction. Such operation of a power MOSFEToccurs when the current in the power MOSFET channel region is, andremains, under the control of the power MOSFET gate. In this state, thedevice conduction stress can be regulated by appropriately modulatingthe signal on the power MOSFET gate. It is understood in the art ofpower MOSFET design and processing that device avalanche stress is morepotentially destructive than device conduction stress.

Various processing techniques are commonly employed to render theinternal parasitic elements of a power MOSFET less susceptible toavalanche-stress induced failure. A problem with these techniques isthat normal variations in the processing parameters of a power MOSFETmay inhibit optimization or reduce the effectiveness of thesetechniques.

Other methods of protection involve the application of external devicesto render the power MOSFET less susceptible to avalanche stress. Onesuch method involves using a drain-source clamp diode: an external diodeconnected between the drain and source of the power MOSFET, whoseavalanche voltage is less than that of the power MOSFET. When the risingdrain-source voltage reaches the avalanche voltage of the drain-sourceclamp diode, the energy stored in the inductor is dissipated in thedrain-source clamp diode rather than the power MOSFET. The amount ofenergy that can be safely dissipated in this fashion depends on thedissipation capability of the drain-source clamp diode--large amounts ofenergy require large clamp diodes. While the drain-source clamp diode isdissipating the inductive energy, the power MOSFET is idle.

A more advantageous method of protection involves diverting a smallfraction of the inductive energy to the power MOSFET gate by means of adrain-gate clamp diode whose avalanche voltage is about two to threevolts less than the avalanche voltage of the power MOSFET. A suitablegate-source termination resistor is also employed in this method. Whenthe rising drain voltage reaches the avalanche voltage of the drain-gateclamp diode, the resulting avalanche current develops a voltage acrossthe gate-source termination resistor which turns on the power MOSFET,effectively clamping its drain to the sum of the drain-gate diodeavalanche voltage and the voltage across the gate-source terminationresistor. In this method the power MOSFET acts as its own clamp, anddissipates the inductive energy in the less stressful conduction mode.It is customary to add a second blocking diode in back-to-backconfiguration with the drain-gate clamp diode to enable the gate-sourcevoltage in normal operation to exceed the drain-source voltage.

An advantage of using a drain-gate clamp over using a drain-source clampis that the drain-gate diode, blocking diode, and gate-sourcetermination resistor handle only enough energy to charge the powerMOSFET input capacitances and therefore may be small in size and cost.

A disadvantage of these external clamp methods is that additional partsare employed to protect the power MOSFET, thus increasing the cost ofthe total system. In addition, the physical layout of some applicationsmay preclude placing the clamp circuitry in close proximity to the powerMOSFET. The resulting parasitic inductances act as impedances that slowthe response time of the clamp circuitry. Therefore the power MOSFET mayhave to endure some avalanche stress until the clamps become active. Itwould be advantageous to provide a means of protecting the power MOSFETthat achieves intimate proximity to the power MOSFET and does notincrease the number of additional system components.

An additional problem that is difficult to control is the change indrain-to-source avalanche voltage of a semiconductor device with devicejunction temperature. For example, the drain-to-source avalanche voltagetemperature coefficient of a 100V power MOSFET is about 9mV per degreeCelsius. Additionally, wafer fabrication variations may result in anavalanche voltage spread of several volts for different waferfabrication lots. While such variations are not a problem in manyapplications, some applications can require a tighter avalanche voltagedistribution with less variation over temperature.

If a drain-gate clamp diode is selected to be a temperature compensatedzener diode, the sustaining voltage of the power MOSFET, being clampedto that of the drain-gate clamp diode, will, to a great extent, also betemperature compensated. In the industry, temperature compensated zenerdiodes can be formed by arranging two diodes in back-to-backconfiguration, one with a zener avalanche voltage of about 5.5 volts andthe other forward biased when the first is reverse biased. The zenerdiode has a positive temperature coefficient (TC) and the forward biaseddiode has a negative temperature coefficient. To achieve a temperaturecompensated voltage reference for the back-to-back to configuration, thepositive temperature coefficient of the zener diode must beapproximately equal in magnitude to that of the negative temperaturecoefficient of the forward-biased junction. It is well known in the artthat a zener diode of about 5.5 bolts has a positive temperaturecoefficient approximately equal in magnitude to that of the negativetemperature coefficient of a forward-biased junction. The resultingavalanche voltage of the two diode back-to-back "zero TC" configurationis about 6.2 bolts.

Higher sustaining voltage power MOSFETs with temperature compensationcould be achieved by connecting a plurality of external zero TC zenerdiodes in series for use as a drain-gate clamp diode. Such a schemewould provide protection of the power MOSFET from avalanche stress andwould provide a temperature compensated sustaining voltage, however, todo so would be cost prohibitive because it would greatly increase thesystem component count. In addition, the number of zero TC diodes may belimited by the physical layout of the system.

By now, it should be appreciated that it would be advantageous toprovide an improved method of protecting a semiconductor device fromavalanche stress which also provides a temperature compensatedsustaining voltage of the semiconductor device.

Accordingly, it is an object of the present invention to provide a highvoltage monolithic temperature compensated voltage reference diode whichcan be used to protect a semiconductor device and provide a temperaturecompensated sustaining voltage of the semiconductor device.

Another object of the present invention is to provide an integratedsemiconductor device having an improved protection scheme andtemperature compensated sustaining voltage.

A further object of the present invention is to provide aself-protecting, integrated semiconductor device which also exhibits atemperature compensated sustaining voltage.

An additional object of the invention is to provide a semiconductordevice with a defined temperature coefficient of sustaining voltage.

SUMMARY OF THE INVENTION

In accordance with the present invention, the above and other objectsand advantages are achieved by providing a high voltage monolithictemperature compensated voltage reference diode between the drain andthe gate of a semiconductor device. The monolithic temperaturecompensated diode is comprised of a plurality of temperature compensateddiode pairs. The diode pairs are formed in polysilicon, stackedback-to-back; the positive temperature coefficient of the avalanchingdiode being compensated for by the negative temperature coefficient ofits forward biased companion. The diode can be used as an externaldrain-gate clamp or more preferably can be easily integrated into suchdevices as power MOSFETs, bipolar transistors, insulated gate bipolartransistors, and the like.

When the high voltage monolithic temperature compensated diode is usedas a drain-gate clamp in a power MOSFET, the diode clamps the MOSFET'ssustaining voltage to the total avalanche voltage of the diode.Inductive fly-back energy, such as is found when switching inductiveloads, is dissipated by the power MOSFET in the conduction mode, ratherthan in the more stressful avalanche mode. In addition, the plurality ofdiode pairs provides for a temperature compensated sustaining voltage ofthe power MOSFET. The number of diode pairs may be varied to achievevarious sustaining voltages independent of the avalanche voltage of thepower MOSFET. Additionally, extra forward biased or reverse biaseddiodes may be added to or subtracted from the plurality to achieve adesired temperature coefficient.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an enlarged cross-sectional view of an embodiment ofthe present invention;

FIG. 2 illustrates a circuit diagram of a semiconductor device embodyingthe present invention; and

FIGS. 3-7 illustrate enlarged cross-sectional views of an integratedsemiconductor device embodying the present invention.

The preferred embodiments of the present invention are illustrated inthe accompanying drawings for purposes of exemplification, and are notto be construed as limiting in any manner.

DETAILED DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an enlarged cross-sectional view of a structureembodying the present invention. First, a semiconductor substrate 10 isprovided. Substrate 10 is preferably silicon of either N or P typematerial. Next, an insulating layer 11, preferably silicon dioxide, isgrown or deposited on substrate 10. Subsequently, a polysilicon layer 12is deposited on insulating layer 11. Then polysilicon layer 12 issubjected to a blanket implant and diffusion of a P-type dopant. TheP-type dopant used in this embodiment is boron at a dose ofapproximately 5×10¹² to 1×10¹⁶ atoms/cm². Other P-type dopants are alsosuitable. In the next step, polysilicon layer 12 is selectivelyimplanted with an N-type dopant and then diffused. The N-type dopantused in this embodiment is phosphorus at a dose of approximately 1×10¹³to 1×10¹⁶ atoms/cm². Other N-type dopants are also suitable. Note thatpolysilicon layer 12 can be doped N-type and then selectively dopedP-type. Subsequently, an insulating layer 13 is deposited on polysiliconlayer 12 and then selectively etched to provide contact areas topolysilicon layer 12 Next, a metallization layer 14 is deposited andetched to provide electrical contact to each end of polysilicon layer12. Thus, a plurality of low voltage diodes, approximately 6-8 volts,can be stacked back-to-back in series to achieve a desirable highvoltage. A zero TC diode is provided when the positive temperaturecoefficient of the avalanching junction is compensated for by thenegative temperature coefficient of the forward biased junction.Furthermore, extra forward biased or reverse biased diodes may be addedor subtracted from the plurality to achieve a desired temperaturecoefficient. The voltage, resistance and temperature coefficient can betailored by the P-type and N-type dopant implantations. The widths ofthe P and N regions are preferably as small as process tolerances willallow to keep resistances down. The structure described requires fewprocessing steps, thus a high voltage, monolithic temperaturecompensated voltage reference diode can be made at a very low cost.

The monolithic temperature compensating diode shown in FIG. 1 can beused as an external device, however, in some applications it would bemore advantageous to integrate the diode into a semiconductor deviceitself. Integrating the diode into a semiconductor device would providefor better protection because the clamp will respond faster due to alower impedance, and will thus prevent the semiconductor device fromenduring stress. In addition, the cost of the system will be loweredbecause additional parts are not employed.

FIG. 2 illustrates a circuit diagram of an embodiment of the presentinvention. A power MOSFET will be used to illustrate where the presentinvention may be integrated, however, the invention is not limited tothis specific device. The present invention can be used in othersemiconductor devices, such as bipolar transistors, insulated gatebipolar transistors (IGBTs), thyristors, and the like. The MOSFET ofFIG. 2 has a gate electrode or control electrode 20, a source electrode21, and a drain electrode or current carrying electrode 22. In a bipolardevice the gate would correspond to a base, the source to an emitter,and the drain to a collector. A polysilicon resistor 29 may beintegrated into the MOSFET of FIG. 2 and electrically connected betweengate 20 and source 21. Resistor 29 facilitates turn on of the powerMOSFET. The MOSFET is illustrated switching an inductive load 24,attached to a supply voltage 25. A drain-gate clamp scheme is providedby placing a series of back-to-back diodes 28 between gate 20 and drain22. Back-to-back diodes 28 are a series of low voltage diodes as shownin FIG. 1. The sum of the reverse and forward voltages of the pluralityof diodes 28 provides for a clamping voltage lower than the avalanchevoltage of the MOSFET. The plurality of the diodes 28 clamps theMOSFET's sustaining voltage to the total avalanche voltage of the diode.Thus, the power MOSFET dissipates any inductive fly-back energy, such asis found when switching inductive loads, in the conduction mode, ratherthan in the more stressful avalanche mode. In addition, the totalvoltage of the plurality of diodes 28 can be chosen to provide anavalanche voltage independent of the avalanche voltage of thesemiconductor device. Furthermore, the plurality of diodes provides fora temperature compensated sustaining voltage of the power MOSFET. Forexample, the sustaining voltage of a 100 volt MOSFET can be maintainedbetween approximately 95 and 105 volts between temperatures of -40° C.to 200° C. This voltage range includes the variation due to temperatureand processing. Processing variations include variations in substrateresistivity and ion implant dose, among others. Prior art MOSFETsexhibit an avalanche voltage between approximately 90 and 125 volts forthe same temperature range.

FIGS. 3-7 illustrate a preferred method of integrating back-to-backdiodes 28 (shown in FIG. 2) into a power MOSFET. The process offabricating a power MOSFET is well known by those skilled in the art,thus the process will only be discussed briefly. FIG. 3 illustrates anenlarged cross-sectional view of a power MOSFET in an early stage offabrication. The fabrication of an N-channel MOSFET will be described,however, the plurality of diodes can also be easily integrated into aP-channel MOSFET. First, a semiconductor substrate 60 of N-type siliconis provided. Next, a silicon dioxide layer 61 is grown and patternedusing standard techniques well known in the industry. Next, P-typeregions 62 are formed in substrate 60, then another silicon dioxidelayer 63 is grown on substrate 60.

FIG. 4 illustrates the structure of FIG. 3 with oxide layers 61 and 63selectively etched. A gate oxide 64 is taken grown on substrate 60. Gateoxide layer 64 does form over oxide layer 63, however, in FIG. 4 gateoxide layer 64 is only illustrated where it was grown directly oversubstrate 60. Next, a gate polysilicon layer 65 then is deposited andselectively etched. Before polysilicon 65 is etched a P-type dopant maybe implanted into polysilicon layer 65 to further lower the resistivityof polysilicon 65.

FIG. 5 illustrates the structure of FIG. 4 with a P-type channel region66 implanted in substrate 60 through gate oxide layer 64. At this time,polysilicon layer 65 is also doped P-type, because layer 65 is notmasked. Next, an opening 68 is defined in oxide layers 61 and 63.

FIG. 6 illustrates the structure of FIG. 5 with a photoresist mask 69masking alternating regions of a portion of polysilicon layer 65.Following the application of photoresist layer 69, the structure isimplanted with an N-type dopant, forming regions 70 in substrate 60. Atthe same time, polysilicon layer 65 is doped N-type where there is noresist 69. Thus, alternating PN junctions, back-to-back diodes 71, areformed in a portion of polysilicon layer 65. A polysilicon resistor (notshown) may also be incorporated into polysilicon layer 65 and connectedbetween gate 20 and source 21 if desired.

FIG. 7 illustrates a way that back-to-back diodes 71 may be connected tothe gate electrode 74 and the drain electrode 76 of the semiconductordevice. First oxide layer 72 is deposited and selectively etched toprovide contact areas for a metallization layer. Note that some regionsof oxide layer 63 are also etched along with oxide layer 72. Ametallization layer is first deposited and then etched to form separatecontacts 73A, 73B, and 73C. Metallization layer 73A makes electricalcontact to a source area of the device. Metallization layer 73B makeselectrical contact to gate electrode 74 of the semiconductor device andto the first junction of back-to-back diodes 71. Metallization layer 73Cmakes electrical contact to the last junction of back-to-back diodes 71and drain electrode 76 of the device, In a vertical power MOSFET, as isillustrated, the drain is substrate 60. Electrical contact to drainelectrode 76 can be made directly to metallization layer 73C withoutmaking contact to substrate 60. Other variations used to make electricalcontact between gate electrode 74 and drain electrode 76 of the devicewill be apparent to those skilled in the art. It will also be apparentto those skilled in the art of processing power MOSFETs that only oneextra photoresist masking layer is required to make the presentinvention.

By now it should be appreciated that there has been provided a new andimproved method of fabricating an integrated semiconductor device havinghigh energy capabilities and a temperature compensated sustainingvoltage.

We claim:
 1. A rugged power MOSFET having high energy protection,comprising:a semiconductor substrate having a polysilicon gate region, asource region, and a drain region thereon; a resistor electricallyconnected to the polysilicon gate region and the source region; and aplurality of temperature compensated voltage polysilicon diodes formedback-to-back adjacent a polysilicon gate pad region, and wherein theplurality of diodes make electrical contact to the polysilicon gateregion and to the drain region and provide for high energy protection tothe semiconductor device from avalanche stress-induced failure duringoperation of the power MOSFET.
 2. The power MOSFET of claim 1 whereinthe plurality of diodes each has a reverse and forward voltage sum ofapproximately 6.2 volts, and wherein the total sum of the forward andthe reverse voltages of the plurality of diodes is less than, butsubstantially close to, the drain-source avalanche voltage of theMOSFET.
 3. A semiconductor device having high energy protection,comprising:a semiconductor substrate having a gate region, a sourceregion and a drain region thereon; a resistor electrically connected tothe gate region and the source region; and a plurality of diodes formedback-to-back in a polysilicon layer over the substrate and connectedbetween the gate region and the drain region, wherein the back-to-backdiodes, having a reverse and forward voltage sum, clamp the sustainingvoltage of the semiconductor device to the reverse and forward voltagesum of the diodes, which protects the semiconductor device fromavalanche stress-induced failure.
 4. A semiconductor device having agate region, a source region, and a drain region, comprising;a pluralityof diodes formed back-to-back in a polysilicon layer electricallyconnected to the gate region and the drain region of the semiconductordevice and monolithically integrated with the semiconductor device; aresistor electrically connected to the gate region and the sourceregion, wherein the plurality of diodes provide a temperaturecompensated sustaining voltage of the semiconductor device.
 5. Thedevice of claim 4 further comprising:the plurality of diodes havingextra forward biased diodes to achieve a desired temperaturecoefficient.
 6. The device of claim 4 further comprising:the pluralityof diodes having extra reverse biased diodes to achieve a desiredtemperature coefficient.
 7. The device of claim 4 furthercomprising:choosing a breakdown voltage of the plurality of diodes toprovide protection to the semiconductor device from avalanchestress-induced failure.
 8. The device of claim 4 further comprising:theplurality of diodes having a breakdown voltage less than the sustainingvoltage of the semiconductor device to provide protection to thesemiconductor device from avalanche stress-induced failure.
 9. Thedevice of claim 4 further comprising:the plurality of diodes having abreakdown voltage less than, but close to, the sustaining voltage of thesemiconductor device to provide protection to the semiconductor devicefrom avalanche stress-induced failure.
 10. The device of claim 4 whereinthe plurality of diodes each have a reverse and forward voltage sum, andwherein the total sum of the forward and the reverse voltages of theplurality of diodes provides for a specified avalanche voltageindependent of an avalanche voltage of the semiconductor device.
 11. Thedevice of claim 4 wherein the resistor is monothically integrated ontothe semiconductor device and is comprised of polysilicon.
 12. The deviceof claim 4 wherein the semiconductor device is a power MOSFET.
 13. Asemiconductor device having a base region, a emitter region, and acollector region, comprising:a plurality of diodes formed back-to-backin a polysilicon layer electrically connected to the base region and thecollector region of the semiconductor device and monolithicallyintegrated with the semiconductor device; a resistor electricallyconnected to the base region and the emitter region, wherein theplurality of diodes provide a temperature compensated sustaining voltageof the semiconductor device.
 14. The device of claim 13 furthercomprising:the plurality of diodes having extra forward biased diodes toachieve a desired temperature coefficient.
 15. The device of claim 13further comprising:the plurality of diodes having extra reverse biaseddiodes to achieve a desired temperature coefficient.
 16. The device ofclaim 13 further comprising:choosing a breakdown voltage of theplurality of diodes to provide protection to the semiconductor devicefrom avalanche stress-induced failure.
 17. The device of claim 13further comprising:the plurality of diodes having a breakdown voltageless than the sustaining voltage of the semiconductor device to provideprotection to the semiconductor device from avalanche stress-inducedfailure.
 18. The device of claim 13 further comprising:the plurality ofdiodes having a breakdown voltage less than, but close to, thesustaining voltage of the semiconductor device to provide protection tothe semiconductor device from avalanche stress-induced failure.
 19. Thedevice of claim 13 wherein the plurality of diodes each have a reverseand forward voltage sum, and wherein the total sum of the forward andthe reverse voltages of the plurality of diodes provides for a specifiedavalanche voltage independent of an avalanche voltage of thesemiconductor device.
 20. The device of claim 13 wherein thesemiconductor device is a bipolar transistor, an insulated gate bipolartransistor, or a thyristor.
 21. The device of claim 13 wherein theresistor is monothically integrated onto the semiconductor device and iscomprised of polysilicon.